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3.1 Motivation
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2.3 JUSO Setup
Contents
3
. Secondary Electron Yield
Subsections
3
.
1
Motivation
3
.
2
Methods
3
.
2
.
1
Net Charge Exchange Model
3
.
2
.
2
Automated Measurement
3
.
3
Results
3
.
3
.
1
Overview
3
.
3
.
2
Angular Dependence
3
.
3
.
3
Time Dependence and UV Sensitivity
3
.
4
Discussion
March 2001 - Martin Wieser, Physikalisches Institut, University of Berne, Switzerland
