2.2 ILENA Setup
Figure 2.1:
ILENA setup
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The experiment ILENA at the University of Bern [11,12,13,14]
(see Figure 2.1) consists of an ion source, a beam
guiding system, a sample stage with housing and with an alkali dispenser
unit (not used for this study), and a detection unit. All these units
are contained in a single vacuum chamber pumped by a turbomolecular
pump. Ions are formed in an electron impact ion source (Nier type),
with the intensity of the primary ion beam of
pA.
Molecular ions of oxygen or hydrogen were used rather than atomic
ions because they can be produced far more efficiently in this system.
The ions are then deflected into a
cylindrical
analyzer with an energy width of the ion beam at the sample of
(FWHM) [11]. The energy analyzer focuses the ion beam
on the entrance aperture of the sample housing. Two diaphragms limit
the beam size to
1mm and the beam divergence to
. The impact angle of the ion beam on the conversion
surface can be varied between
and
with respect to the surface normal. The reflected beam is recorded
with a two-dimensional position-sensitive micro channel plate (MCP)
detector with a viewing angle of
in the azimuthal
direction and
in the polar direction. A retarding
potential analyzer (RPA) consisting of three grids is mounted in front
of the MCP detector. The detector unit, including the RPA, is shielded
electrostatically and can be rotated independently of the conversion
surface around the same axis. The outer grids of the RPA are grounded
to shield the inner grid, which can be biased to suppress positive
ions. An additional grid in front of the MCP detector at negative
potential with respect to the MCP detector serves to reject secondary
electrons originating from the preceding grids and the converter surface.
The MCP detector may be floated to a negative high voltage with respect
to the converter surface to eliminate negative particles. After baking
out the vacuum chamber a residual gas pressure of
mbar
is achieved. During operation the pressure may rise into the low
mbar
range as a result of the test gas leaking into the ion source chamber.
The sample can be heated in order to remove adsorbates from the surface.
A filament next to the surface allows scattering experiments to be
carried out with insulating surfaces that would charge up otherwise.
March 2001 - Martin Wieser, Physikalisches Institut, University of Berne, Switzerland